Article 12215

Title of the article

                                      ACCELERATED TESTING OF DIGITAL-ANALOG CONVERTERS AND                                        MONITORING AND CONTROL SYSTEM THEREOF


Solodimova Galina Anatol'evna, Candidate of engineering sciences, chief metrologist, head of the scientific
and technical center and metrological support, Research Institute of Electronic and Mechanical Instruments (44 Karakozova street, Penza, Russia),
Svetlov Anatoliy Vil'evich, Doctor of engineering sciences, professor, head of sub-department of radio engineering and radio electronic system, Penza State University (40 Krasnaya street, Penza, Russia),
Ishkov Anton Sergeevich, Candidate of engineering sciences, associate professor, sub-department of radio engineering and radio electronic system, Penza State University (40 Krasnaya street, Penza, Russia),
Lemaev Roman Andreevich, Candidate of engineering sciences, head of department, Scientific production enterprise “Rubin” (2 Baydukova street, Penza, Russia),
Tsypin Boris Vul'fovich, Doctor of engineering sciences, professor, sub-department of space-rocket and aircraft instrument engineering (on the basis of “RIFM” Plc.), Penza State University (40 Krasnaya street, Penza, Russia),

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Background. Widely used in measuring and operating systems the DAC chips are promising products. However, broad application of the specified products in equip-ment demands maintenance of their technical parameters at permanently high level. One of ways of ensuring reliability of chips is to organize a system of production control of the DAC parameters, which is an important scientific and technical task. The work purpose is to develop a modern automated workplace of a test engineer al-lowing to carry out accelerated testing of chips.
Materials and methods. Measurement of the DAC parameters is carried out using standard measuring instruments and the original techniques of conformity assessment of the DAC parameters to the values established in technical documentation.
Results. The authors have developed an automated workplace of a test engineer for carrying out the accelerated testing of DAC for reliability with application of the precision element base and modern measuring instruments for obtaining high metro-logical characteristics.
Conclusions. Development of the automated workplace of a test engineer al-lowed to considerably increase the quality of DAC accelerated testing due to prompt data acquisition and possibility of monitoring the course of testing.

Key words

hybrid DAC, automation testing, reliability.

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Дата создания: 02.10.2015 15:18
Дата обновления: 05.10.2015 14:26